Optical Properties of Flash Evaporated Thin Films: Effect of Film Thickness

Citation:
Mulama AA, Mwabora JM, Oduor AO, Muiva C. Optical Properties of Flash Evaporated Thin Films: Effect of Film Thickness. United Kenya Club; 2013.

Abstract:

Thin films of 〖 Se〗_(100-x) 〖Bi〗_x (x=0.0,1.5,3.0,4.5 and 6.0 at.%) deposited by flash evaporation technique, have been investigated in the wavelength range of 500nm-1000nm. It is found that the effect of increasing bismuth content on the as deposited films led to increase in the absorption coefficient, reflectance, refractive index, extinction coefficient, real and imaginary parts of dielectric constant while transmittance and optical band gap energy decreased. On the other hand, reflectance, absorption coefficient, extinction coefficient, refractive index, band gap energy, real and imaginary parts of dielectric constant increased with increase in film thickness but transmittance decreased.

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